Government Tender Published for SPECTROPHOTOMETER in BHOPAL, MADHYA PRADESH
Bid Publish Date
14-Oct-2025, 5:46 pm
Bid End Date
18-Nov-2025, 6:00 pm
EMD
₹1,25,000
Location
Progress
National Forensic Sciences University invites bids for SPECTROPHOTOMETER (Q2) in BHOPAL, MADHYA PRADESH. Quantity: 1. Submission Deadline: 18-11-2025 18: 00: 00. Submit your proposal before the deadline.
Tender Data
Bid Details
Quantity
1
Bid Type
Two Packet Bid
Bid Validity
180 (Days)
Bid Type
Service
Evaluation
Total value wise evaluation
Inspection Required
No
RA Qualification Rule
H1-Highest Priced Bid Elimination
Tech Clarification Time
2 Days
Requirements
Min. Avg. Annual Turnover
12
OEM Avg. Turnover
100
Past Performance
80 %
Experience Required
3 Year (s)
Arbitration Clause
No
Mediation Clause
No
Additional Tender Data
Commercial Details
Tender Category
Goods
Bid To RA
No
Bid To RA Enabled
Yes
Item Category
SPECTROPHOTOMETER (Q2)
Authority Records
BID & GeM Expert Consultancy
End-to-end support — bid preparation, GeM registration, document filing & compliance by industry experts.
Free consultation · 24h response
Documents 6
GeM-Bidding-8473316.pdf
Main Document
Other Documents
OTHER
Other Documents
OTHER
CATALOG-Specification-38-items
CATALOG Specification
Buyer uploaded ATC document
ATC
GEM General Terms and Conditions Document
GEM_GENERAL_TERMS_AND_CONDITIONS
Corrigendum Updates
2 Updates Update
Extended Deadline
18-Nov-2025, 12:30 pm
Opening Date
18-Nov-2025, 1:00 pm
Update
Extended Deadline
11-Nov-2025, 12:30 pm
Opening Date
11-Nov-2025, 1:00 pm
Required Documents
Experience Criteria
Past Performance
Bidder Turnover
Certificate (Requested in ATC)
OEM Authorization Certificate
OEM Annual Turnover
Compliance of BoQ specification and supporting document *In case any bidder is seeking exemption from Experience / Turnover Criteria
the supporting documents to prove his eligibility for exemption must be uploaded for evaluation by the buyer
Technical Specifications
1 Item
Item #1 Details
View Catalog| Category | Specification | Requirement |
|---|---|---|
| LIGHT SOURCE | Light Source | Halogen Lamp, Deuterium Lamp, LED, Tungsten Halogen Lamp, Xenon Flash |
| LIGHT SOURCE | Diffraction Grating (lines/mm) | 600, 800, 1000, 1200, 1400, 1600, 1800 |
| LIGHT SOURCE | Switching of Light Source | Automatic, Mannual, NA |
| LIGHT SOURCE | Wavelength Setting And Scanning | Automatic, Mannual |
| TYPE | Type of Spectrophotometer | UV - VISIBLE, VISIBLE, UV - VISIBLE - IR, NIR, UV-VIS, UV-Visible spectrophotometer, double beam/split beam, microprocessor controlled with dual source assembly |
| TYPE | Type of Optical System | Single Beam, Split Beam, Double Beam |
| TYPE | Monochromator Type | Reflexive Grating, Holographic Grating, Czerny-turner, NA, Scanning grating |
| TYPE | Detector Type | Photo Multiplier Tube (PMT), Photodiode, CMOS, Diode array, Silicon, Silicon & Lead Sulfide, Indium Gallium Arsenide (InGaAs) |
| TYPE | Spectral Bandwidth Type | Fixed Bandwidth, Variable Bandwidth |
| OPTICAL PERFORMANCE | Source Wavelength - Minimum | 175, 180, 185, 190, 195, 200, 320, 340, 400, 570, 850, 950, 460 |
| OPTICAL PERFORMANCE | Source Wavelength - Maximum | 320, 340, 760, 780, 900, 960, 1000, 1100, 1500, 2000, 2500, 2700, 3000, 3200, 3300, 1650, 644 Or higher |
| OPTICAL PERFORMANCE | Resolution | 0.002, 0.3, 0.5, 1, 1.25, 1.5, 1.7, 2, 0.2, 0.01 |
| OPTICAL PERFORMANCE | Wavelength Accuracy (+/-) | 0.1, 0.3, 0.5, 0.8, 1, 1.5, 2, 2.5, 0.05 |
| OPTICAL PERFORMANCE | Bandwidth (nm) | 0.1, 0.2, 0.5, 1, 1.5, 1.8, 2.0, 4.0, 5.0, 0.1 to 5.0, 7, 8.5 |
| OPTICAL PERFORMANCE | Focal length (mm) | 0 to 49, 50 to 99, 100 to 149, 150 to 199, 200 to 249, 250 to 299, 300 and above |
| OPTICAL PERFORMANCE | Photometric measurement modes | Transmittance, Absorbance, Concentration (Wavelength, time), Reflectance, Energy, Polarisation |
| OPTICAL PERFORMANCE | Photometric Absorbance (Max) (Abs) (+/-) | 0.2 - 8 |
| OPTICAL PERFORMANCE | Photometric Absorbance Accuracy (Max) (+/-) | 0.001 - 0.5 |
| OPTICAL PERFORMANCE | Photometric Transmittance (Max) (+/-) | 0 - 100 |
| OPTICAL PERFORMANCE | Photometric Transmittance Accuracy (Max) (+/-) | 0 - 0.5 |
| OPTICAL PERFORMANCE | Photometric Reflectance (Max) (+/-) | 0 - 100 |
| GENERIC | Display | In-built display, Through PC |
| GENERIC | Display type | LCD with Backlight, LED, LCD touchscreen, TFT, NA |
| GENERIC | Display Size | 0 - 30 |
| GENERIC | Test result printing | Through inbuilt Printer, Through external printer |
| GENERIC | If inbuilt printer, Type of printer | Thermal printer, Dot matrix, Laser b/w, Inkjet b/w, Color laser, Color inkjet, N/A |
| GENERIC | Internal storage(GB) | 0 - 80 |
| GENERIC | Mximum Path Length of sample | 0 - 120 |
| GENERIC | Number of Cuvettes supplied-inclusive in the scope of supply | 10, 25, 50, 100, 200, 300, 400, 500, 2, 4, 6, 8, 0 |
| GENERIC | Spares and Consumables inclusive in the scope of supply | Yes, No |
| OPERATING CONDITIONS | Minimum Operating Temperature | -5, -10, 0, 5, 10 |
| OPERATING CONDITIONS | Maximum Operating Temperature | 35, 40, 45, 50, 55, 60 |
| OPERATING CONDITIONS | Operating Humidity (RH) (%) at 40 degree C | 80, 85, 90, 95 |
| WARRANTY | Onsite Warranty | 1, 2, 3, 4, 5 |
| WARRANTY | Availability of Spares (at extra cost) | 2, 3, 4, 5, 6, 7, 8, 10 |
| Certification | Availability of UL/CE Certification as per EN 61010-1:2010 Safety requirements for electrical equipment for measurement, control, and laboratory use General requirements | Yes, No |
| Certification | Conformance to EMC/EMI as per EN 61326-1:2013 Electrical equipment for measurement, control and laboratory use | Yes, No |
| Certification | Availability of Test Reports from Central Govt / NABL approved / ILAC acredited lab to prove conformity to the specification | Yes, No |